WebDec 12, 2024 · Abstract The results of an experimental study by X-ray photoelectron spectroscopy of the chemical composition of the surface of polyethylene naphthalate films modified by low-pressure dc discharge at the anode and cathode are presented. Filtered atmospheric air was used as the plasma gas. X-ray photoelectron spectroscopy has been … Webneutralization with high sensitivity and excellent energy resolution. The K-Alpha XPS System was used to investigate the surfaces formed by peeling the polypropylene protective layer from a dry film. The dry film was mounted on a PET substrate, as shown in Figure 1. The chemistry of the dry film was also investigated with K-Alpha XPS System.
High resolution XPS of organic polymers: the Scienta ESCA300 database
WebApr 14, 2024 · In the high-resolution O 1s spectra (Figure 5d), three peaks at 529.1, 530.2, and 531.6 eV can be assigned to the oxygen bonded to Ce, Zn, and surface hydroxyl radicals [33,37,38], respectively. Overall, the XPS and HRTEM results indicate that a heterojunction interface between ZnO and CeO 2 nanoparticles is formed via pyrolysis. The interface ... WebSep 15, 2012 · The NIST XPS Database gives access to energies of many photoelectron and Auger-electron spectral lines. The database contains over 29,000 line positions, chemical shifts, doublet splittings, and energy separations of photoelectron and Auger-electron lines. ... High Resolution XPS of Organic Polymers: the Scienta ESCA300 Database (1992) Data ... highland elementary school baltimore
High resolution monochromated X-ray photoelectron …
WebHigh resolution XPS of organic polymers: The Scienta ESCA 300 database. G. Beamson and D. Briggs. 280pp., £65. John Wiley & Sons, Chichester, ISBN 0471 935921, (1992) - Watts - … WebOct 31, 1992 · TL;DR: In this article, the binding energy scale for sample charging curve fitting lineshapes shake-up structure valence bands impurities x-ray degradation … WebApr 8, 2013 · These stratified films were dried then analyzed using depth-profiling XPS paired with C 60 + sputtering to collect C1s, O1s, N1s, and Si2p high-resolution spectra. It is important to note that prolonged X-ray exposure and C 60 + sputtering may alter the chemical composition of PEMs and decrease the interface resolution ( 36 , 48 ). highland elementary school ambridge pa